Equipment

Specifications

• JRS Scientific Instruments Tandem Fabry-Perot Interferometer TFP-1 (frequency range 0 - 1000 GHz)
• Conventional backward-scattering with wavevector resolution in BV and DE configurations
• Micro-focused setup with 100X 0.75NA Objective and travel range of 120um
• Nd:Vanadate laser operating at 532 nm
• Hitatchi photomultiplier with dark current less than 2 counts per second
• Two electromagnets with magnetic fields up to 8 kG (micro-focused setup) and 3kG (wavevector-resolved setup)
• Integrated Picoprobe station with two ports for the micro-focused setup

Measures microwave absorption in order to characterize various magnetic properties.

Measures electrical resistance as a function of applied field in exchange-coupled magnetic films.

System for the microwave characterization of on-wafer devices up to 110 GHz.

Specifications

• Performance Network Analyzer (PNA) E8361A (0-67 GHz)
• Millimeter Head Controler (N5260A) + Waveguide T/R module with a bias-T (up to 110GHz)
• Pico-probe excitation and detection

Optical system for measuring hysteresis curves in ultrathin magnetic structures.

Specifications

• Magnetic Field Range: ± 2.5 kOe
• Diode laser at 670 nm and 4 mW power
• High-quality polarizers
• Temperature Range: 20 K - 400 K

• Ultra-high vacuum chamber for deposition and in-situ characterization of ultrathin magnetic films.
• Growth Chamber
  • 8 thermal evaporation sources and linear 4 pocket e-gun
  • Reflection High Energy Electron Diffraction
  • Residual Gas Analyzer unit
  • Thickness monitor
• Analysis Chamber
  • Low Energy Electron Diffraction units
  • Auger Electron Spectroscopy and Ion Sputtering units
• k-Space Associate CCD Camera system (KSA400) for data acquisition of diffraction images
• Base pressure of 10-10 TorrSophisticated sample manipulator with five degrees of freedom operating at 150-1000 K